The excitation, reflection, and utilization in crystal-structure analyses of characteristic secondary X-rays

被引：0

|

作者：

Clark, GL ^{[1
]}

机构：

[1] Harvard Imov, Jefferson Phys Lab, Cambridge, MA USA

来源：

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 1924年 / 46卷

关键词：

D O I：

10.1021/ja01667a012

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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页码：372 / 384

页数：13

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