STUDY ON SUPERCOOLING OF BISMUTH THIN-FILMS USING ELECTRON-DIFFRACTION

被引:6
|
作者
DAVID, MJ [1 ]
BERTY, J [1 ]
LAFOURCADE, L [1 ]
机构
[1] UNIV TOULOUSE 3, PHYS STRUCT LAB, CNRS, EQUIPE RECH CINET CRISTALLOCHIM COUCHES MINCE, F-31077 TOULOUSE, FRANCE
关键词
D O I
10.1016/0040-6090(77)90060-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:177 / 185
页数:9
相关论文
共 50 条
  • [21] ELLIPTIC ELECTRON-DIFFRACTION PATTERNS FROM THIN-FILMS OF TURBOSTRATIC GRAPHITE
    SCHIFFMACHER, G
    DEXPERT, H
    CARO, P
    COWLEY, JM
    [J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1980, 5 (06): : 729 - &
  • [22] LOW-ENERGY ELECTRON-DIFFRACTION BY THIN-FILMS .2.
    STACHULEC, K
    [J]. ACTA PHYSICA HUNGARICA, 1986, 59 (3-4) : 247 - 255
  • [23] DETERMINATION OF THIN-FILMS THERMAL-EXPANSION BY ELECTRON-DIFFRACTION METHOD
    PUGACHEV, AT
    CHURAKOVA, NP
    [J]. IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1993, 57 (02): : 126 - 128
  • [24] ELECTRON-DIFFRACTION DETERMINATION OF STRUCTURE OF THIN-FILMS INTLS2
    AGAEV, KA
    GASYMOV, VA
    CHIRAGOV, MI
    [J]. KRISTALLOGRAFIYA, 1973, 18 (02): : 366 - 368
  • [25] ELECTRON-DIFFRACTION STUDY OF THIN NICKEL HYDRIDE FILMS
    KHODYREV, YP
    BARANOVA, RV
    SEMILETOV, SA
    [J]. RUSSIAN METALLURGY, 1977, (02): : 183 - 187
  • [26] ELECTRON-DIFFRACTION STUDY OF TANTALUM IDOXIDE IN THIN FILMS
    KHITROVA, VI
    KLECHKOV.VV
    PINSKER, ZG
    [J]. SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1968, 12 (06): : 907 - &
  • [27] STRUCTURAL DETERMINATION OF AMORPHOUS NI-TI THIN-FILMS USING ELECTRON-DIFFRACTION ANALYSIS
    MOINE, P
    DELAGE, J
    PELTON, AR
    SINCLAIR, R
    [J]. ACTA METALLURGICA ET MATERIALIA, 1992, 40 (08): : 1855 - 1863
  • [28] ELECTRON-DIFFRACTION STUDY OF VACUUM-DEPOSITED IN2TE3 THIN-FILMS
    ROUSINA, R
    SHIVAKUMAR, GK
    [J]. SURFACE & COATINGS TECHNOLOGY, 1989, 38 (03): : 353 - 358
  • [29] ELECTRON-DIFFRACTION PATTERN METHOD OF INVESTIGATING THE THERMAL-EXPANSION OF THIN-FILMS
    PUGACHEV, AT
    CHURAKOVA, NP
    [J]. INDUSTRIAL LABORATORY, 1980, 46 (08): : 813 - 815
  • [30] ELECTRON-DIFFRACTION ANALYSIS OF THE GROWTH OF HYDROGENATED AMORPHOUS-SILICON THIN-FILMS
    VANDERHAGHEN, R
    CHAURAND, B
    DREVILLON, B
    [J]. THIN SOLID FILMS, 1985, 124 (3-4) : 293 - 299