IDENTIFICATION OF IRON-OXIDES BY SECONDARY ION EMISSION USING IONS PROBE MICROANALYSIS

被引：0

作者：

NAMDARIRANI, R ^{[1
]}

机构：

[1] INST RECH SIDERURG FRANCAISE,F-78100 ST GERMAIN EN LAV,FRANCE

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1977年 / 2卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：293 / 300

页数：8

共 50 条

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