IDENTIFICATION OF IRON-OXIDES BY SECONDARY ION EMISSION USING IONS PROBE MICROANALYSIS

被引：0
|
作者：
NAMDARIRANI, R [1 ]
机构：
[1] INST RECH SIDERURG FRANCAISE,F-78100 ST GERMAIN EN LAV,FRANCE
来源：
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1977年 / 2卷 / 03期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：293 / 300
页数：8
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