WIREWOUND RESISTORS OFFER BUILT-IN CIRCUIT PROTECTION

被引：0
|
作者：
SANDONE, F [1 ]
HARTLEY, J [1 ]
机构：
[1] TRW,IRC,PHILADELPHIA,PA 19100
来源：
ELECTRONIC PRODUCTS MAGAZINE | 1973年 / 16卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：153 / &
相关论文
共 50 条
  • [41] Digital on-chip measurement circuit for built-in phase noise testing
    David-Grignot, S.
    Azais, F.
    Latorre, L.
    Lefevre, F.
    PROCEEDINGS OF THE 2015 IEEE 20TH INTERNATIONAL MIXED-SIGNAL TESTING WORKSHOP (IMSTW), 2015,
  • [42] A versatile built-in CMOS sensing device for digital circuit parametric test
    Dragic, MS
    Margala, M
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2003, 52 (06) : 1756 - 1764
  • [43] Hierarchical built-in test equipment of circuit system based on boundary scan
    Wang Nantian
    Li Yue
    Hu Zheng
    Liu Xiubin
    PROCEEDINGS OF 2015 IEEE 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS (ICEMI), VOL. 1, 2015, : 48 - 52
  • [44] An Output Response Analyzer Circuit for ADC Built-in Self-Test
    Ting, Hsin-Wen
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2011, 27 (04): : 455 - 464
  • [45] A Built-in Supply Current Test Circuit for Pin Opens in Assembled PCBs
    Umezu, Shoichi
    Hashizume, Masaki
    Yotsuyanagi, Hiroyuki
    2014 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP), 2014, : 227 - 230
  • [46] A Built-In Self-Test and In Situ Analog Circuit Optimization Platform
    Lee, Sanghoon
    Shi, Congyin
    Wang, Jiafan
    Sanabria, Adriana
    Osman, Hatem
    Hu, Jiang
    Sanchez-Sinencio, Edgar
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2018, 65 (10) : 3445 - 3458
  • [47] A DIFFERENTIAL DUAL INTEGRATED CIRCUIT VIDEO IF WITH BUILT-IN AGC FOR COLOR TELEVISION
    AUGUSTIN.LG
    IEEE TRANSACTIONS ON BROADCAST AND TELEVISION RECEIVERS, 1968, BT14 (02): : 116 - &
  • [48] Open Defect Detection in Assembled Circuit Boards With Built-In Relaxation Oscillators
    Ikiri, Yuki
    Sako, Fumiya
    Hashizume, Masaki
    Yotsuyanagi, Hiroyuki
    Lu, Shyue-Kung
    Yazaki, Toru
    Ikeda, Yasuhiro
    Uematsu, Yutaka
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2021, 11 (06): : 931 - 943
  • [49] Fuzzy-based CMOS circuit partitioning in built-in current testing
    Tseng, WD
    Wang, KC
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 1999, 7 (01) : 116 - 120
  • [50] BUILT-IN DYNAMIC CURRENT SENSOR CIRCUIT FOR DIGITAL VLSI CMOS TESTING
    SEGURA, J
    ROCA, M
    MATEO, D
    RUBIO, A
    ELECTRONICS LETTERS, 1994, 30 (20) : 1668 - 1669
12345