APPLICATION OF THE OPTIMAL EXPERIMENT THEORY METHODS FOR RADIOELECTRONIC EQUIPMENT RELIABILITY ENHANCEMENT

被引：0

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作者：

LAPTEV, AK

机构：

来源：

IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA | 1991年 / 34卷 / 06期

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中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：98 / 100

页数：3

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