CALCULATION OF WHITE-LIGHT MTF IN THE EXISTENCE OF LATERAL CHROMATIC ABERRATION

被引:0
|
作者
OGAWA, R [1 ]
TACHIHARA, S [1 ]
机构
[1] ASAHI OPT CO LTD PENTAX,DEPT OPT RES,ITABASHI KU,TOKYO 174,JAPAN
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1037 / 1037
页数:1
相关论文
共 50 条
  • [21] Precise Correction of Lateral Chromatic Aberration in Images
    Rudakova, Victoria
    Monasse, Pascal
    IMAGE AND VIDEO TECHNOLOGY, PSIVT 2013, 2014, 8333 : 12 - 22
  • [22] A circular white-light flare with impulsive and gradual white-light kernels
    Hao, Q.
    Yang, K.
    Cheng, X.
    Guo, Y.
    Fang, C.
    Ding, M. D.
    Chen, P. F.
    Li, Z.
    NATURE COMMUNICATIONS, 2017, 8
  • [23] A circular white-light flare with impulsive and gradual white-light kernels
    Q. Hao
    K. Yang
    X. Cheng
    Y. Guo
    C. Fang
    M. D. Ding
    P. F. Chen
    Z. Li
    Nature Communications, 8
  • [24] Chromatic dispersion characterization of a chirped mirror with wavelet analysis of white-light spectral interferograms
    Deng, Yuqiang
    Yang, Weijian
    Zhou, Chun
    Wang, Xi
    Tao, Jun
    Kong, Weipeng
    Zhang, Zhigang
    2009 LASERS & ELECTRO-OPTICS & THE PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1 AND 2, 2009, : 59 - +
  • [25] DISCRIMINATION OF CHROMATIC FROM WHITE-LIGHT BY 2-MONTH-OLD HUMAN INFANTS
    TELLER, DY
    PEEPLES, DR
    SEKEL, M
    VISION RESEARCH, 1978, 18 (01) : 41 - 48
  • [26] White-Light Interferometer Based on a High-Precision Chromatic Dispersion Measurement Method
    Kim, Seung Hwan
    Kim, Kyong Hon
    Lee, Seoung Hun
    Lee, Sukmock
    Lee, Min Hee
    Lee, El-Hang
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2008, 53 (06) : 3201 - 3206
  • [27] Shape selection of wavelets for accurate chromatic dispersion measurement of white-light spectral interferograms
    Y. Deng
    W. Yang
    Z. Zhang
    Applied Physics B, 2010, 98 : 347 - 351
  • [28] Shape selection of wavelets for accurate chromatic dispersion measurement of white-light spectral interferograms
    Deng, Y.
    Yang, W.
    Zhang, Z.
    APPLIED PHYSICS B-LASERS AND OPTICS, 2010, 98 (2-3): : 347 - 351
  • [29] CHROMATIC DISPERSION MEASUREMENT FROM FOURIER-TRANSFORM OF WHITE-LIGHT INTERFERENCE PATTERNS
    FRANCOIS, PL
    ALARD, F
    MONERIE, M
    ELECTRONICS LETTERS, 1987, 23 (07) : 357 - 358
  • [30] Lateral resolution and transfer characteristics of vertical scanning white-light interferometers
    Xie, Weichang
    Lehmann, Peter
    Niehues, Jan
    APPLIED OPTICS, 2012, 51 (11) : 1795 - 1803