A high-temperature X-ray camera for precision measurements

被引:9
|
作者
Jay, AH
机构
来源
关键词
D O I
10.1088/0959-5309/45/5/303
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:635 / 642
页数:9
相关论文
共 50 条
  • [41] A PRECISION X-RAY POWDER CAMERA
    FRONDEL, C
    AMERICAN MINERALOGIST, 1955, 40 (9-10) : 876 - 884
  • [42] THE TEMPERATURE CALIBRATION OF A HIGH TEMPERATURE X-RAY DIFFRACTION CAMERA
    BRAND, JA
    GOLDSCHMIDT, HJ
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1956, 33 (02): : 41 - 45
  • [43] A NEW TYPE OF HIGH-TEMPERATURE X-RAY CAMERA FOR CHEMICAL REACTIONS IN THE SOLID STATE
    KUBO, T
    AKABORI, H
    JOURNAL OF PHYSICAL AND COLLOID CHEMISTRY, 1950, 54 (08): : 1121 - 1131
  • [44] HIGH-TEMPERATURE SAMPLE CELL FOR KRATKY SMALL-ANGLE X-RAY CAMERA
    BRUMBERGER, H
    ALEXANDROPOULOS, NG
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (11): : 1579 - +
  • [45] HIGH-TEMPERATURE X-RAY DIFFRACTION MEASUREMENTS OF ZnO VARISTOR CERAMICS.
    Takemura, Taketoshi
    Kobayashi, Masahiro
    Takada, Yoshio
    Sato, Ken
    1600, (25):
  • [46] NEUTRON AND X-RAY EXPERIMENTS AT HIGH-TEMPERATURE
    ALDEBERT, P
    REVUE DE PHYSIQUE APPLIQUEE, 1984, 19 (09): : 649 - 662
  • [47] A DEVICE FOR HIGH-TEMPERATURE X-RAY PHOTOGRAPHY
    GINDIN, EI
    PROKHVATILOV, VG
    INDUSTRIAL LABORATORY, 1958, 24 (01): : 103 - 104
  • [48] HIGH-TEMPERATURE X-RAY TOPOGRAPHY OF SILICON
    GRIENAUER, H
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (03) : C97 - +
  • [49] X-RAY CAMERAS FOR HIGH-TEMPERATURE STUDIES
    KAPYSHEV, AG
    VENEVTSE.YN
    SOLOVEV, SP
    GORBUNOV, LA
    ZHDANOV, GS
    INDUSTRIAL LABORATORY, 1965, 30 (10): : 1577 - &
  • [50] HIGH-TEMPERATURE X-RAY DIFFRACTION APPARATUS
    VANVALKENBURG, A
    MCMURDIE, HF
    JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1947, 38 (04): : 415 - 418