THERMOMIGRATION OF TELLURIUM PRECIPITATES IN CDZNTE CRYSTALS GROWN BY VERTICAL BRIDGMAN METHOD

被引:14
|
作者
LEE, TS [1 ]
PARK, JW [1 ]
JEOUNG, YT [1 ]
KIM, HK [1 ]
CHUN, CH [1 ]
KIM, JM [1 ]
PARK, IH [1 ]
CHANG, JM [1 ]
KIM, SU [1 ]
PARK, MJ [1 ]
机构
[1] KOREA UNIV,SEOUL 136701,SOUTH KOREA
关键词
CDZNTE; EFFECTIVE DIFFUSION COEFFICIENT; TE PRECIPITATES; THERMOMIGRATION VELOCITY; X-RAY DIFFRACTION;
D O I
10.1007/BF02653052
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Te precipitates in CdZnTe have been characterized by x-ray diffraction at room and higher temperatures. From the x-ray results at room temperature, it has been confirmed that Te precipitates in CdZnTe have the same structural phase as observed in elemental Te under high pressure. The x-ray results at higher temperature indicate that Te precipitates melt around 440 degrees C. CdZnTe samples containing Te precipitates have been annealed at temperatures below and above 440 degrees C with thermal gradient of similar to 70 degrees C/cm. Results of the observation with infrared microscope before and after the annealings indicate distinct occurrence of thermomigration of Te precipitates in samples annealed at temperature above 440 degrees C compared with ones annealed at temperature below 440 degrees C. Thermomigration velocity obtained from these results is similar to 50 mu m/h. The average value for the effective diffusion coefficient of the metallic atoms in Te precipitates calculated by using the thermomigration velocity is similar to 3 x 10(-5) cm(2)/s.
引用
收藏
页码:1053 / 1056
页数:4
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