Seventy-nine lines of the small-seeded common bean (Phaseolus vulgaris L.) from the second cycle of selection (SCS) were evaluated for seed yield, days to maturity, and reaction to diseases at ten locations in Brazil. All lines were also tested at CIAT-Quilichao, Colombia. Additionally, 20 of these lines were tested with two cultivars from the first cycle of selection (FCS) and three other checks at three locations for three years in Colombia. Significant differences for seed yield were found among lines in Brazil and Colombia. Of 79 lines from the SCS, 15 lines outyielded the check EMGOPA-Ouro (A 295) from the FCS. Eleven lines also outyielded the best check cultivar Carioca across environments in Brazil and Colombia. Positive associations were found for mean seed yield over five growing seasons at CNPAF-Goiania, Brazil, with yield at EMGOPA-Goiania, IAPAR-Londrina, EMCAPA-Linhares, EMPASC-Chapeco, CNPCO-Poco Verde, and IPA-Arcoverde, Brazil. Mean yield across all sites in Brazil correlated positively with mean yield in Colombia. Correlation coefficients between scores in Brazil and Colombia for common bacterial blight and angular leaf spot were positive and significant (P < 0.01). Improved lines had higher resistance to these two diseases and to anthracnose, bean golden mosaic virus, and rust.