THE EFFECTS OF ABRASION GETTERING ON SILICON MATERIAL WITH SWIRL DEFECTS

被引：7
|
作者：
REED, CL
MAR, KM
机构：
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1980年 / 127卷 / 09期
关键词：
D O I：
10.1149/1.2130066
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：2058 / 2062
页数：5
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