Gettering of defects in silicon by porous silicon

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Huang, Yiping [1 ]
Zhu, Shiyang [1 ]
Bao, Zongming [1 ]
He, Yi [1 ]
Zhong, Huizhou [1 ]
Wu, Dongping [1 ]
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[1] Fudan Univ, Shanghai, China
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页码:936 / 939
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