BIPOLAR TRANSISTOR SCREENING METHODS FOR NEUTRON HARDNESS ASSURANCE

被引：2

作者：

BLICE, RD ^{[1
]}

MUNARIN, JA ^{[1
]}

PEASE, RL ^{[1
]}

机构：

[1] USN,AMMUNITION DEPOT,CRANE,IN 47522

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1972年 / NS19卷 / 06期

关键词：

D O I：

10.1109/TNS.1972.4326818

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：115 / 120

页数：6

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