SEM IRRADIATION FOR HARDNESS ASSURANCE SCREENING AND PROCESS DEFINITION

被引：9
|
作者：
COHEN, S
HUGHES, H
机构：
[1] RCA,SOLID STATE TECHNOL CTR,SOMERVILLE,NJ 08876
[2] USN,RES LAB,WASHINGTON,DC
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1974年 / NS21卷 / 06期
关键词：
D O I：
10.1109/TNS.1974.6498958
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：387 / 389
页数：3
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