Calculations of van der Waals Forces Across Films of Liquid Helium Using Lifshitz Theory

被引：45
|
作者：
Richmond, P. [1 ]
Ninham, B. W. [2 ]
机构：
[1] Univ New S Wales, Sch Phys, Kensington, NSW 2033, Australia
[2] Univ New S Wales, Dept Appl Math, Kensington, NSW 2033, Australia
来源：
JOURNAL OF LOW TEMPERATURE PHYSICS | 1971年 / 5卷 / 02期
关键词：
D O I：
10.1007/BF00629571
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Lifshitz theory of van der Waals forces is used to calculate. film heights and third-sound velocities for films of liquid helium on substrates of BaF2 and CaF2. The calculated film heights are in excellent agreement with the experimental values of Anderson and Sabinsky for film thicknesses greater than or similar to 50 angstrom. At smaller distances, despite unavoidable theoretical uncertainties due to incomplete dielectric data, comparison of theory with experiment indicates that any "dense" layer adjacent to the substrate has an effective thickness of less than a single atomic layer.
引用
收藏
页码：177 / 189
页数：13
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