HYDROGEN AND DEUTERIUM ION-BOMBARDMENT EFFECTS IN SIO2-FILMS

被引:4
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作者
BELSON, J
WILSON, IH
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D O I
10.1109/TNS.1979.4330234
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:4819 / 4823
页数:5
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