DEDUCTIVE METHOD FOR SIMULATING FAULTS IN LOGIC CIRCUITS

被引：97
|
作者：
ARMSTRONG, DB
机构：
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1972年 / C 21卷 / 05期
关键词：
D O I：
10.1109/T-C.1972.223542
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：464 / +
页数：1
相关论文
共 50 条
  • [21] A Systematic Approach to Modeling and Analysis of Transient Faults in Logic Circuits
    Miskov-Zivanov, Natasa
    Marculescu, Diana
    ISQED 2009: PROCEEDINGS 10TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, VOLS 1 AND 2, 2009, : 408 - 413
  • [22] A DFT methodology for detecting bridging faults in reversible logic circuits
    Bubna, Mayur
    Goyal, Nitin
    Sengupta, Indranil
    TENCON 2007 - 2007 IEEE REGION 10 CONFERENCE, VOLS 1-3, 2007, : 567 - 570
  • [23] ANALYSIS OF LOGIC CIRCUITS WITH FAULTS USING INPUT SIGNAL PROBABILITIES
    PARKER, KP
    MCCLUSKEY, EJ
    IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (05) : 573 - 578
  • [24] DEDUCTIVE LOGIC OF COMPUTERS
    CHESNEAUX, J
    QUINZAINE LITTERAIRE, 1983, (393): : 26 - 27
  • [25] EVALUATE MODEL TYPES BEFORE SIMULATING LOGIC-CIRCUITS
    MOFFAT, K
    CARTER, D
    EDN, 1988, 33 (06) : 187 - &
  • [26] Deductive logic.
    Ferguson, KG
    HISTORY AND PHILOSOPHY OF LOGIC, 2004, 25 (04) : 334 - 335
  • [27] DETECTION OF MULTIPLE FAULTS USING SSFTS IN CMOS LOGIC-CIRCUITS
    TONG, CQ
    LU, D
    COMPUTERS & ELECTRICAL ENGINEERING, 1995, 21 (04) : 271 - 280
  • [28] Nonstuck behaviour of open circuit supply faults in CMOS logic circuits
    Johnson, S
    Morant, MJ
    IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, 1996, 143 (01): : 9 - 13
  • [29] A design-for-testability technique for detecting delay faults in logic circuits
    Raahemifar, K
    Ahmadi, M
    ISCAS '98 - PROCEEDINGS OF THE 1998 INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-6, 1998, : 201 - 204
  • [30] Reliability evaluation of logic circuits based on transient faults propagation metrics
    Cai, Shuo
    Yu, Fei
    Wang, Weizheng
    Liu, Tieqiao
    Liu, Peng
    Wang, Wei
    IEICE ELECTRONICS EXPRESS, 2017, 14 (07):
12345