DISTRIBUTION OF SODIUM IN SPUTTERED SIO2 AS DETERMINED BY NEUTRON-ACTIVATION AND UV SPECTROGRAPHIC ANALYSES

被引:7
|
作者
KUMAR, S [1 ]
GREGOR, LV [1 ]
机构
[1] IBM CORP,SYST PROD DIV,HOPEWELL JUNCTION,E FISHKILL,NY 12533
关键词
D O I
10.1149/1.2403681
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
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页码:1285 / 1287
页数:3
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