BACKSCATTERING CORRECTION FOR QUANTITATIVE AUGER ANALYSIS .2. VERIFICATIONS OF THE BACKSCATTERING FACTORS THROUGH QUANTIFICATION BY AES

被引：48

作者：

ICHIMURA, S ^{[1
]}

SHIMIZU, R ^{[1
]}

IKUTA, T ^{[1
]}

机构：

[1] OSAKA ELECTROCOMMUN UNIV,DEPT APPL ELECTR,NEYAGAWA,OSAKA 572,JAPAN

来源：

SURFACE SCIENCE | 1982年 / 115卷 / 02期

关键词：

D O I：

10.1016/0039-6028(82)90406-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：259 / 269

页数：11

共 38 条

[1] BACKSCATTERING CORRECTION FOR QUANTITATIVE AUGER ANALYSIS .3. A SIMPLE FUNCTIONAL REPRESENTATION OF ELECTRON BACKSCATTERING FACTORS
ICHIMURA, S
SHIMIZU, R
LANGERON, JP
SURFACE SCIENCE, 1983, 124 (2-3) : L49 - L54
[2] BACKSCATTERING CORRECTION FOR QUANTITATIVE AUGER ANALYSIS .1. MONTE-CARLO CALCULATIONS OF BACKSCATTERING FACTORS FOR STANDARD MATERIALS
ICHIMURA, S
SHIMIZU, R
SURFACE SCIENCE, 1981, 112 (03) : 386 - 408
[3] CORRECTION OF BACKSCATTERING EFFECTS IN THE QUANTIFICATION OF AUGER DEPTH PROFILES
BARKSHIRE, IR
PRUTTON, M
SKINNER, DK
SURFACE AND INTERFACE ANALYSIS, 1991, 17 (04) : 213 - 218
[4] A NEW METHOD TO DETERMINE BACKSCATTERING FACTORS FOR QUANTITATIVE AUGER ANALYSIS
WANG, Q
ZHANG, QJ
HUA, ZY
APPLICATIONS OF SURFACE SCIENCE, 1985, 22-3 (MAY): : 160 - 167
[5] DETERMINATION OF BACKSCATTERING FACTOR FOR QUANTITATIVE AUGER ANALYSIS
PALCZYNSKI, J
DOLINSKI, W
MROZ, S
SURFACE SCIENCE, 1991, 247 (2-3) : 395 - 401
[6] NEW METHOD TO DETERMINE BACKSCATTERING FACTORS FOR QUANTITATIVE AUGER ANALYSIS.
Wang, Q.
Zhang, Q.J.
Hua, Z.Y.
Applications of surface science, 1984, 22-23 : 160 - 167
[7] BACKSCATTERING CORRECTION FACTOR FOR AU-CU ALLOYS IN QUANTITATIVE AUGER ANALYSIS
DING, ZJ
SHIMIZU, R
ICHIMURA, S
SURFACE AND INTERFACE ANALYSIS, 1987, 10 (05) : 253 - 258
[8] A PRACTICAL METHOD FOR DETERMINING BACKSCATTERING FACTORS AND MATRIX CORRECTION IN QUANTITATIVE AES ANALYSIS OF BINARY-ALLOYS
STREUBEL, P
BERNDT, H
SURFACE AND INTERFACE ANALYSIS, 1984, 6 (02) : 48 - 55
[9] A NEW EXPERIMENTAL PROCEDURE FOR THE BACKSCATTERING CORRECTION IN AUGER ANALYSIS
BENHAYOUNE, H
JBARA, O
THOMAS, X
MOUZE, D
CAZAUX, J
SURFACE AND INTERFACE ANALYSIS, 1993, 20 (07) : 600 - 602
[10] QUANTITATIVE CORRECTION OF BACKSCATTERING IN AUGER-ELECTRON SPECTROSCOPY OF THIN-FILMS
LEVEQUE, G
BONNET, J
APPLIED SURFACE SCIENCE, 1995, 89 (02) : 211 - 219

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