SCANNING TUNNELING MICROSCOPY INVESTIGATIONS OF ORGANIC THIN-FILM TOPOGRAPHY

被引：3
|
作者：
TROYANOVSKIJ, AM [1 ]
HIETSCHOLD, M [1 ]
KHAIKIN, MS [1 ]
ANDROSCH, I [1 ]
VOLLMANN, W [1 ]
STARKE, M [1 ]
机构：
[1] TECH UNIV KARL MARX STADT,SEKT PHYS ELEKTRON BAUELEMENTE,O-9010 KARL MARX STADT,GERMANY
来源：
THIN SOLID FILMS | 1990年 / 188卷 / 02期
关键词：
D O I：
10.1016/0040-6090(90)90295-O
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We present scanning tunnelling microscopy images of the surface topography of thin films of erbium bis(phthalocyanine) and tetrathiafulvalene-tetracyanoquinodimethane (TTF-TCNQ). The images are obtained under low vacuum conditions for specimens which have been stored in the open air for several days. Comparison is made with scanning electron microscopy and transmission electron microscopy micrographs. Reproducible features can be interpreted as microcrystallites and in the case of TTF-TCNQ even as molecular growth steps. © 1990.
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页码：329 / 333
页数：5
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