METALLURGICAL APPLICATIONS OF SEM AND MICROPROBE IMAGE-ANALYSIS

被引：0

作者：

BENOIT, D

DEMAGNY, H

JEULIN, D

OSMONT, P

机构：

[1] INST RECH SIDERURGIE FRANCAISE,F-57210 MAIZIERES METZ,FRANCE

[2] CTR GEOSTAT,F-77305 FONTAINEBLEAU,FRANCE

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1987年 / 12卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：181 / 184

页数：4

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