OPTICAL-PROPERTIES OF MNAL FILMS

被引:1
|
作者
ANGADI, MA
THANIGAIMANI, V
机构
[1] Department of Physics, The University of the West Indies, Trinidad, West Indies, St. Augustine
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1990年 / 51卷 / 05期
关键词
78.65;
D O I
10.1007/BF00348388
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The optical properties of MnAl films of different compositions, deposited at different substrate temperatures and in the thickness range 25 to 90 nm, are reported. The reflectance and transmittance are measured in the wavelength range 320-900 nm for near normal incidence of light. These measurements are used to calculate the optical constants namely, refractive index (n) and extinction coefficient (k). The wavelength and thickness dependence of these optical constants are reported. The optical measurements for films with higher Mn content and grown at higher substrate temperature reveal that n and k values are constant over a wide wavelength range (500-900 nm) showing high reflectance in the visible and near infrared region. © 1990 Springer-Verlag.
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页码:446 / 450
页数:5
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