ANALYTIC METHODS FOR GENERATION OF FAULT DETECTING TESTS FOR COMBINATIONAL CIRCUITS

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作者：

CHIPULIS, VP

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AUTOMATION AND REMOTE CONTROL | 1974年 / 35卷 / 08期

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中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

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页码：1338 / 1341

页数：4

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