TECHNIQUE FOR RIVET-MOUNTING SAMPLES FOR SCANNING ELECTRON-MICROSCOPY

被引：3

作者：

OMEARA, DC ^{[1
]}

BAYER, RC ^{[1
]}

机构：

[1] UNIV MAINE,DEPT ANIM & VET SCI,ORONO,ME 04473

来源：

TRANSACTIONS OF THE AMERICAN MICROSCOPICAL SOCIETY | 1974年 / 93卷 / 02期

关键词：

D O I：

10.2307/3225298

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：264 / 265

页数：2

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