APPLICATION OF A MICROWAVE-INDUCED PLASMA ATOMIC EMISSION DETECTOR FOR QUANTIFICATION OF HALOGENATED COMPOUNDS BY GAS-CHROMATOGRAPHY

被引:30
|
作者
KOVACIC, N
RAMUS, TL
机构
[1] Dow Chemical Company, Pittsburg, CA 94565
关键词
MICROWAVE-INDUCED PLASMA; GAS CHROMATOGRAPHIC DETECTION; COMPOUND INDEPENDENT CALIBRATION; ATOMIC EMISSION DETECTOR;
D O I
10.1039/ja9920700999
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A series of halogenated and oxygenated heterocyclic, aromatic and aliphatic compounds were evaluated for elemental calibration with the atomic emission detector for gas chromatography (GC-AED). The GC-AED monitored C, Cl, F, N and O signals for these compounds and elemental response factors (ERF) were evaluated for compound independence. The variation in ERF for C, Cl, F, N and O were evaluated and found to be less than 3, 6, 5, 6 and 5% relative standard deviation (RSD), respectively, for all the compounds tested. Significant ERF compound dependence was identified for Cl in one of the compound groups and F in all compound groups. However, the ERF variation only increased from 5 to 6% RSD for Cl and from 2 to 5% RSD for F after including the compound dependent bias. Compound independent calibration can be utilized if these errors are acceptable for a particular application. The linearity of ERF with concentration and GC-AED reagent gas composition were also evaluated.
引用
收藏
页码:999 / 1005
页数:7
相关论文
共 50 条