A NEW TECHNIQUE FOR MEASURING THE CONSTITUTIVE PARAMETERS OF PLANAR MATERIALS

被引：10
|
作者：
SCOTT, WR
机构：
[1] School of Electrical Engineering, Georgia Institute of Technology, Atlanta
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1992年 / 41卷 / 05期
关键词：
D O I：
10.1109/19.177335
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A technique for measuring the constitutive parameters of materials over a broad range of frequencies is developed in this work. The technique is specifically designed for planar samples. Planar samples can be placed in the measurement fixture without any special preparation; this makes the technique more convenient than other techniques which require that the sample be machined to fit into a measurement fixture. The finite element method is used in the analysis of the fixture. Using fourth-order elements, the finite element method provides a general, very accurate solution. The technique is experimentally verified by measuring the constitutive parameters of two materials with known properties. The measured results are compared to those of other investigators and are shown to be in good agreement.
引用
收藏
页码：639 / 645
页数：7
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