WEAK-BEAM MICROSCOPY

被引：0

作者：

VANDERSANDE, JB ^{[1
]}

机构：

[1] MIT,CAMBRIDGE,MA 02139

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1980年 / 127卷 / 08期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：C387 / C387

页数：1

共 50 条

[1] WEAK-BEAM ELECTRON-MICROSCOPY
COCKAYNE, DJH
ANNUAL REVIEW OF MATERIALS SCIENCE, 1981, 11 : 75 - 95
[2] WEAK-BEAM MICROSCOPY SYMPOSIUM AT EMCON 1972
RAY, I
JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (JUL): : 115 - 115
[3] WEAK-BEAM METHOD IN ELECTRON-MICROSCOPY
ARMIGLIA.A
VALDRE, U
JOURNAL OF SUBMICROSCOPIC CYTOLOGY, 1972, 4 (01): : 128 - &
[4] THE USE OF SUPERLATTICE REFLECTIONS FOR WEAK-BEAM MICROSCOPY
NGAN, AHW
JONES, IP
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1993, 68 (03): : 525 - 535
[5] The benefits of energy-filtering in weak-beam microscopy
Jenkins, ML
Martin, SP
Hetherington, CJD
Kirk, MA
ELECTRON MICROSCOPY: ITS ROLE IN MATERIALS SCIENCE: THE MIKE MESHII SYMPOSIUM, 2003, : 13 - 24
[6] PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
COCKAYNE, DJ
JOURNAL OF MICROSCOPY, 1973, 98 (JUL) : 116 - 134
[7] DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY
COCKAYNE, DJH
HONS, A
JOURNAL DE PHYSIQUE, 1979, 40 : 11 - 18
[8] THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
COCKAYNE, DJ
ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03): : 452 - +
[9] WEAK-BEAM ELECTRON-MICROSCOPY OF FAULTED DIPOLES IN DEFORMED SILICON
WINTER, AT
MAHAJAN, S
BRASEN, D
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1978, 37 (03): : 315 - 326
[10] WEAK-BEAM ELECTRON-MICROSCOPY OF RADIATION-INDUCED SEGREGATION
SAKA, H
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1983, 48 (02): : 239 - 250

← 1 2 3 4 5 →