ATOMIC FORCE MICROSCOPY - A TOOL FOR SURFACE SCIENCE

被引：15
|
作者：
FROMMER, J [1 ]
MEYER, E [1 ]
机构：
[1] IBM CORP,ALMADEN RES LAB,SAN JOSE,CA 95114
来源：
JOURNAL OF PHYSICS-CONDENSED MATTER | 1991年 / 3卷
关键词：
D O I：
10.1088/0953-8984/3/S/001
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The understanding and manipulation of surfaces have been greatly helped by a variety of atomic force microscopes.
引用
收藏
页码：S1 / S9
页数：9
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