RELIABILITY OF LEDS AND QUATERNARY PHOTODIODES

被引：0
|
作者：
FUKUDA, M [1 ]
SUDO, H [1 ]
KAIZU, K [1 ]
机构：
[1] NIPPON TELEGRAPH & TEL PUBL CORP, APPL ELECTR LABS, TOKYO 100, JAPAN
来源：
REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES | 1987年 / 35卷 / 06期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：747 / 751
页数：5
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