2-PROBE METHOD OF MEASURING RESITIVITY OF SEMICONDUCTOR DISKS

被引：0
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作者：
BERNIKOV, EP
RVACHEV, AL
机构：
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR | 1969年 / 03期
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T [工业技术];
学科分类号：
08 ;
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页码：749 / &
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