2-PROBE METHOD OF MEASURING RESITIVITY OF SEMICONDUCTOR DISKS

被引：0

|

作者：

BERNIKOV, EP

RVACHEV, AL

机构：

来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR | 1969年 / 03期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：749 / &

相关论文

共 50 条

[1] 2-PROBE METHOD OF MEASURING ELECTRICAL-RESISTIVITY OF COKE BEDS
GALPERN, VV
PINCHUK, SI
STAROVOI.AG
COKE & CHEMISTRY USSR, 1973, (10): : 18 - 22
[2] DETERMINATION OF ION TEMPERATURE BY 2-PROBE METHOD
MAKITA, H
KURIKI, K
REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (03): : 371 - 373
[3] CONNECTION BETWEEN THE LANGMUIR PROBE-CHARACTERISTIC METHOD AND THE 2-PROBE METHOD FOR THE DETERMINATION OF ELECTRON TEMPERATURES
TVERDOKHLEBOV, VI
SOVIET PHYSICS-TECHNICAL PHYSICS, 1957, 2 (04): : 681 - 683
[4] ACCURATE MOVEMENT OF 2-PROBE COMPONENTS
OSINSKI, CJ
DRURY, CG
ERGONOMICS, 1995, 38 (02) : 337 - 346
[5] THEORY OF MEASURING MAGNETORESISTANCE OF SEMICONDUCTOR FILMS BY PROBE METHOD
TESHABAEV, A
DADAMIRZ.G
SOVIET PHYSICS SEMICONDUCTORS-USSR, 1971, 5 (05): : 880 - +
[6] MEASURING OF CONDUCTIVITY FOR INHOMOGENEOUS SEMICONDUCTOR LAYERS BY MEANS OF PROBE METHOD
Konkov, VL
Pavlov, NI
Polyakov, NN
IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1971, (10): : 33 - +
[7] APPARATUS FOR 2-PROBE CONDUCTIVITY MEASUREMENTS ON COMPRESSED POWDERS
WUDL, F
BRYCE, MR
JOURNAL OF CHEMICAL EDUCATION, 1990, 67 (08) : 717 - 718
[8] CALIBRATING 2-PROBE, GAMMA-GAUGE DENSITOMETERS
VANBAVEL, CHM
LASCANO, RJ
BAKER, JM
SOIL SCIENCE, 1985, 140 (05) : 393 - 395
[9] RELATION BETWEEN 2-PROBE AND 4-PROBE RESISTANCES ON NONUNIFORM STRUCTURES
BERKOWITZ, HL
ALBERS, J
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (03) : C100 - C100
[10] THE RELATION BETWEEN 2-PROBE AND 4-PROBE RESISTANCES ON NONUNIFORM STRUCTURES
ALBERS, J
BERKOWITZ, HL
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (02) : 392 - 398

← 1 2 3 4 5 →