SCANNING PHOTOEMISSION MICROSCOPY OF SURFACES

被引：0
|
作者：
ROTERMUND, HH [1 ]
ERTL, G [1 ]
SESSELMANN, W [1 ]
机构：
[1] SIEMENS AG,CORP RES & TECHNOL,D-8000 MUNICH 83,FED REP GER
来源：
SURFACE SCIENCE | 1989年 / 217卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：L383 / L390
页数：8
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