Scanning photoemission microscopy of photo-cathode surfaces

被引：1
|
作者：
Shaw, J. L. [1 ]
Yater, J. E. [1 ]
Butler, J. E. [1 ]
Feldman, D. W. [2 ]
Moody, N. [2 ]
O'Shea, P. G. [2 ]
机构：
[1] USN, Res Lab, Code 6843, Washington, DC 20375 USA
[2] Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USA
来源：
2006 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE HELD JOINTLY WITH 2006 IEEE INTERNATIONAL VACUUM ELECTRON SOURCES | 2006年
关键词：
emission microscope; cold cathode; photoemission; negative electron affinity;
D O I：
10.1109/IVELEC.2006.1666367
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We describe a scanning photoemission microscope using afocused laser beam. We find the system can provide photoemission images with similar to 10 mu m resolution. Images of Cs deposited in local areas on clean p-GaAs showed that the Cs does not move significantly even when heated to 450C.
引用
收藏
页码：431 / +
页数：2
相关论文
共 50 条
12345