THE VISCOSITY OF AMORPHOUS METALLIC THIN-FILMS

被引：16
|
作者：
WITVROUW, A
VOLKERT, CA
SPAEPEN, F
机构：
[1] Division of Applied Sciences, Harvard University, Cambridge
来源：
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1991年 / 134卷
关键词：
D O I：
10.1016/0921-5093(91)90972-P
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Creep and stress relaxation measurements on sputtered amorphous Pd-Si films show that the viscosity in these materials is similar to that of melt-quenched ribbons of similar composition: it increases linearly with time during isothermal structural relaxation, and the rate of increase as well as the isothermal activation enthalpy are similar over a wide range of temperatures and viscosities. This validates the earlier assumption that sample preparation is not a factor in the comparison of the viscosity of melt-quenched ribbons and the diffusivity in sputtered multilayers.
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页码：1274 / 1277
页数：4
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