DIRECTION-SENSITIVE DISPLACEMENT ANALYSIS BY MULTIPLE FREQUENCY HOLOGRAPHIC-INTERFEROMETRY

被引：4
|
作者：
HOLLOWAY, DC [1 ]
PATACCA, AM [1 ]
FOURNEY, WL [1 ]
机构：
[1] WESTINGHOUSE ELECT CORP,CTR DEF & ELECTR SYST,BALTIMORE,MD 21203
来源：
APPLIED OPTICS | 1978年 / 17卷 / 08期
关键词：
D O I：
10.1364/AO.17.001213
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1213 / 1219
页数：7
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