LOCALIZED DEPTH DISTRIBUTION IN THE BOMBARDED SURFACE OF AG-CU ALLOY

被引：0

作者：

WANG, WM ^{[1
]}

WANG, ZX ^{[1
]}

LUN, RG ^{[1
]}

ZHU, FY ^{[1
]}

WU, XK ^{[1
]}

GUO, TM ^{[1
]}

ZHU, JQ ^{[1
]}

机构：

[1] CHINA CTR ADV SCI & TECHNOL,WORLD LAB,BEIJING 100080,PEOPLES R CHINA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 104卷 / 1-4期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Combined with electron microbeam techniques such as scanning electron microscopy and electron-induced X-ray emission, a helium microbeam is used to study the effect of Ar+ ion bombardment on the surface of a binary alloy Ag37CuB63 by particle-induced X-ray emission and Rutherford backscattering. A pronounced change of the surface concentration and depth profile has been found at both Cu-enriched solid solution micro-region and Ag-enriched eutectic mixture micro-region on the alloy surface due to ion bombardment, The preferential sputtering of Ag and bombardment-induced surface segregation is suggested to be attributed to the composition change in the near-surface regions, A superposition of depth distributions determined from different micro-phase-regions is experimentally confirmed.

引用

页码：552 / 556

页数：5

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