LOCALIZED DEPTH DISTRIBUTION IN THE BOMBARDED SURFACE OF AG-CU ALLOY

被引：0
|
作者：
WANG, WM [1 ]
WANG, ZX [1 ]
LUN, RG [1 ]
ZHU, FY [1 ]
WU, XK [1 ]
GUO, TM [1 ]
ZHU, JQ [1 ]
机构：
[1] CHINA CTR ADV SCI & TECHNOL,WORLD LAB,BEIJING 100080,PEOPLES R CHINA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 104卷 / 1-4期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Combined with electron microbeam techniques such as scanning electron microscopy and electron-induced X-ray emission, a helium microbeam is used to study the effect of Ar+ ion bombardment on the surface of a binary alloy Ag37CuB63 by particle-induced X-ray emission and Rutherford backscattering. A pronounced change of the surface concentration and depth profile has been found at both Cu-enriched solid solution micro-region and Ag-enriched eutectic mixture micro-region on the alloy surface due to ion bombardment, The preferential sputtering of Ag and bombardment-induced surface segregation is suggested to be attributed to the composition change in the near-surface regions, A superposition of depth distributions determined from different micro-phase-regions is experimentally confirmed.
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页码：552 / 556
页数：5
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