PREDICTION OF MOS INTEGRATED-CIRCUIT RELIABILITY USING THE METHOD OF WORKING REGIONS

被引：0

作者：

ORNATSKII, MM

POPOV, VD

机构：

来源：

SOVIET MICROELECTRONICS | 1980年 / 9卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：63 / 68

页数：6

共 50 条

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[10] EPOXY PELLETS IMPROVE INTEGRATED-CIRCUIT RELIABILITY
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