共 50 条
- [43] Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy P C Magazine: The Independent Guide to IBM - Standard Personal Computers, 1994, 13 (21):
- [45] Ballistic-electron-emission microscopy: A nanometer-scale probe of interfaces and carrier transport ANNUAL REVIEW OF MATERIALS SCIENCE, 1996, 26 : 189 - 222
- [48] CHARACTERIZING HOT-CARRIER TRANSPORT IN SILICON HETEROSTRUCTURES WITH THE USE OF BALLISTIC-ELECTRON-EMISSION MICROSCOPY PHYSICAL REVIEW B, 1993, 48 (08): : 5712 - 5715
- [49] AU/N-ZNSE CONTACTS STUDIED WITH USE OF BALLISTIC-ELECTRON-EMISSION MICROSCOPY PHYSICAL REVIEW B, 1995, 51 (04): : 2357 - 2362
- [50] LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE FOR BALLISTIC-ELECTRON-EMISSION MICROSCOPY AND SPECTROSCOPY REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (01): : 91 - 96