DISLOCATION TYPE ANALYSIS IN OXYGEN-CONTAINING SILICON SINGLE-CRYSTALS USING COMPUTED ELECTRON-MICROGRAPHS

被引：0
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作者：
SOROKIN, LM
RUVIMOV, SS
LIKHODEDOV, NP
USOV, OA
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来源：
FIZIKA TVERDOGO TELA | 1980年 / 22卷 / 10期
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中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
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页码：3100 / 3106
页数：7
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