SELECTING TEST PATTERNS FOR 4K RAMS

被引：4
|
作者：
SOHL, WE [1 ]
机构：
[1] MACRODATA CORP,WOODLAND HILLS,CA 91367
来源：
IEEE TRANSACTIONS ON MANUFACTURING TECHNOLOGY | 1977年 / 6卷 / 03期
关键词：
D O I：
10.1109/TMFT.1977.1136237
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：51 / 60
页数：10
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