WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE ANALYSIS USING SYNCHROTRON RADIATION

被引：1
|
作者：
Ohashi, Kazutaka [1 ]
Iide, Atsuo [2 ]
Gohshi, Yohichi [1 ]
机构：
[1] Univ Tokyo, Dept Ind Chem, Fac Engn, Bunkyo Ku, Tokyo 113, Japan
[2] Natl Lab High Energy Phys, Photon Factory, Tsukuba, Ibaraki 305, Japan
来源：
ANALYTICAL SCIENCES | 1991年 / 7卷
关键词：
wavelength dispersive; X-ray fluorescence; synchrotron radiation; position sensitive detector;
D O I：
10.2116/analsci.7.Supple_361
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
Wavelength dispersive X-ray fluorescence (WDXRF) analysis using synchrotron radiation (SR) is useful for non-destructive micro analysis of practical samples. We constructed the WDXRF system using SR in which a flat crystal analyzer combined with a position sensitive detector and studied experimental parameters which affect the signal to background ratio and the energy resolution.
引用
收藏
页码：361 / 364
页数：4
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