POLARIZATION PHOTOSENSITIVITY OF CUINSE2 CDS THIN-FILM HETEROJUNCTIONS

The phenomenon of polarization photosensitivity of CuInSe2/CdS thin film heterojunctions due to anisotropic transmission of linear polarized radiation (LPR) through the air-CdS polycrystalline film interface was detected. The parameters of polarization photosensitivity are shown as functions of the angle of oblique incidence theta and the incident photon energy LPR. The induced photopleochroism coefficient P increased with increasing angle in accordance with the law p = theta2, and at theta congruent-to 80-degrees it reached 64%. As follows from polarization measurements photosensitivity, CuInSe2/CdS thin films heterostructures can be used as broadband LPR photoanalysers.