HIGH-RESOLUTION COMPTON PROFILE OF SI USING 29.5-KEV SYNCHROTRON-RADIATION X-RAYS

被引：14
|
作者：
SAKAI, N
SHIOTANI, N
ITOH, F
MAO, O
ITO, M
KAWATA, H
AMEMIYA, Y
ANDO, M
机构：
[1] KEK NAT LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN
[2] TOHOKU UNIV,INST MAT RES,SENDAI,MIYAGI 980,JAPAN
来源：
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1989年 / 58卷 / 09期
关键词：
D O I：
10.1143/JPSJ.58.3270
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：3270 / 3279
页数：10
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