COMPTON-ELECTRON SPECTROSCOPY USING HIGH-ENERGY SYNCHROTRON X-RAYS

被引：1
|
作者：
GUARDALA, NA
PRICE, JL
LAND, DJ
SIMONS, DG
LEE, DH
JOHNSON, BM
GLASS, GA
BRENNAN, JG
机构：
[1] USN,CTR SURFACE WARFARE,WHITE OAK LAB,SILVER SPRING,MD 20903
[2] BROOKHAVEN NATL LAB,UPTON,NY 11973
[3] UNIV SW LOUISIANA,LAFAYETTE,LA 70504
[4] CATHOLIC UNIV AMER,WASHINGTON,DC 20064
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 347卷 / 1-3期
关键词：
D O I：
10.1016/0168-9002(94)91937-2
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Compton-recoil electron spectra have been measured using high-energy (46 and 56 keV) synchrotron X-rays produced at the National Synchrotron Light Source. Thin foils of C and Al (< 1500 angstrom thick) were used as targets. The emitted electrons were detected at 0-degrees-C with respect to the incident photon beam using an electrostatic analyzer with an overall energy resolution of approximately 3%.
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页码：504 / 506
页数：3
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