SENSITIVITY OF SHEARING INTERFEROMETER

被引：0
|
作者：
POLSTER, HD [1 ]
机构：
[1] PERKIN ELMER CORP,S WILTON,CT 06897
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1974年 / 64卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：559 / 559
页数：1
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