ORIENTATION OF CRYSTALS USING A GEIGER COUNTER X-RAY SPECTROMETER

被引：1

|

作者：

JAMES, JA

机构：

来源：

JOURNAL OF SCIENTIFIC INSTRUMENTS | 1950年 / 27卷 / 12期

关键词：

D O I：

10.1088/0950-7671/27/12/302

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：326 / 326

页数：1

相关论文

共 50 条

[1] A GEIGER COUNTER X-RAY CRYSTAL SPECTROMETER
MCKEOWN, PJA
UBBELOHDE, AR
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1954, 31 (09): : 321 - 326
[2] GEIGER-COUNTER X-RAY SPECTROMETER
不详
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1945, 22 (08): : 155 - 155
[3] DETERMINATION OF PREFERRED ORIENTATION IN FLAT TRANSMISSION SAMPLES USING A GEIGER COUNTER X-RAY SPECTROMETER
SCHULZ, LG
[J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (11) : 1033 - 1035
[4] A GEIGER COUNTER SPECTROMETER FOR X-RAY FLUORESCENCE ANALYSIS
FRIEDMAN, H
BRIKS, LS
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1948, 19 (05): : 323 - 330
[5] ORGANIC QUANTITATIVE ANALYSIS USING THE GEIGER COUNTER X-RAY SPECTROMETER
CHRIST, CL
BARNES, RB
WILLIAMS, EF
[J]. ANALYTICAL CHEMISTRY, 1948, 20 (09) : 789 - 795
[6] MEASUREMENT OF THE INTENSITIES OF X-RAY REFLECTIONS FROM SINGLE CRYSTALS USING A GEIGER COUNTER X-RAY SPECTROMETER - APPLICATION TO BERYLLIUM OXIDE
ROTH, WL
[J]. SCIENCE, 1950, 112 (2912) : 447 - 447
[7] A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER
SCHULZ, LG
[J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (11) : 1030 - 1032
[8] PREFERRED ORIENTATION DETERMINATION USING A GEIGER COUNTER X-RAY DIFFRACTION GONIOMETER
DECKER, BF
ASP, ET
HARKER, D
[J]. JOURNAL OF APPLIED PHYSICS, 1948, 19 (04) : 388 - 392
[9] A FAST SCANNING MECHANISM FOR USE WITH A GEIGER COUNTER X-RAY SPECTROMETER
ADAM, J
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1952, 29 (10): : 324 - 325
[10] THE GEIGER COUNTER AS AN X-RAY DOSIMETER
FULLER, WF
BLESS, AA
[J]. PHYSICAL REVIEW, 1946, 69 (9-10): : 545 - 545

← 1 2 3 4 5 →