A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER

被引：860

|

作者：

SCHULZ, LG

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1949年 / 20卷 / 11期

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D O I：

10.1063/1.1698268

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1030 / 1032

页数：3

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