Precision lattice constants from x-ray powder photographs

被引：586
|
作者：
Cohen, MU [1 ]
机构：
[1] Columbia Univ, Dept Chem, New York, NY USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1935年 / 6卷 / 03期
关键词：
D O I：
10.1063/1.1751937
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：68 / 74
页数：7
相关论文
共 50 条
  • [21] Lattice dynamics of stishovite from powder inelastic X-ray scattering
    Bosak, A.
    Fischer, I.
    Krisch, M.
    Brazhkin, V.
    Dyuzheva, T.
    Winkler, B.
    Wilson, D.
    Weidner, D.
    Refson, K.
    Milman, V.
    GEOPHYSICAL RESEARCH LETTERS, 2009, 36
  • [22] PRECISION MOULDING TECHNIQUE FOR X-RAY POWDER SPECIMENS
    LINDSEY, K
    FRANKS, A
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1964, 41 (11): : 700 - &
  • [23] OBLIQUE-TEXTURE X-RAY PHOTOGRAPHS - MORE INFORMATION FROM POWDER DIFFRACTION
    RIEDER, M
    WEISS, Z
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1991, 197 (1-2): : 107 - 114
  • [24] MEASUREMENTS OF INTENSITIES FROM X-RAY PHOTOGRAPHS
    ABRAHAMSSON, S
    ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 158 - +
  • [25] USE OF DIGITAL MICRODENSITOMETER IN ANALYSIS OF X-RAY POWDER DIFFRACTION PHOTOGRAPHS
    PIHL, CF
    BIEBER, RL
    ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S260 - S260
  • [26] THE CORRECTION OF X-RAY DIFFRACTION POWDER PHOTOGRAPHS FOR HIGHLY ABSORBING SAMPLES
    JENSEN, PE
    RITCHIE, EJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1957, 104 (08) : C163 - C163
  • [27] MODIFICATIONS TO A TRAVELLING MICROSCOPE USED FOR MEASURING X-RAY POWDER PHOTOGRAPHS
    ARMSTRONG, WE
    DAVIS, RJ
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1958, 35 (02): : 59 - 61
  • [28] Apparatus for making x-ray powder photographs at controlled, elevated temperatures
    Buerger, MJ
    Buerger, NW
    Chesley, FG
    AMERICAN MINERALOGIST, 1943, 28 (05) : 285 - 302
  • [29] X-RAY POWDER CAMERA FOR TAKING PHOTOGRAPHS AT LOW-TEMPERATURES
    BUERGER, MJ
    SHOEMAKER, GL
    AMERICAN MINERALOGIST, 1978, 63 (9-10) : 824 - 826
  • [30] Automated prediction of lattice parameters from X-ray powder diffraction patterns
    Chitturi, Sathya R.
    Ratner, Daniel
    Walroth, Richard C.
    Thampy, Vivek
    Reed, Evan J.
    Dunne, Mike
    Tassone, Christopher J.
    Stone, Kevin H.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2021, 54 (54): : 1799 - 1810
12345