ATOM-PROBE FIELD-ION MICROSCOPY OF GAAS AND GAP

被引：0

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作者：

OHNO, Y

KURODA, T

NAKAMURA, S

机构：

来源：

SURFACE SCIENCE | 1978年 / 75卷 / 04期

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D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

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页码：689 / 702

页数：14

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